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Physical principles of electro...
Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
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Bibliographic Details
Main Author:
Egerton, R. F.
(Author)
Format:
Book
Language:
English
Published:
New York, NY :
Springer,
c2005
Subjects:
elektronová mikroskopie
ISBN:
9780387258000
0387258000
Physical Description:
xii, 202 s. : il. ; 25 cm
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