Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
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| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York, NY :
Springer,
c2005
|
| Subjects: | |
| ISBN: | 9780387258000 0387258000 |
| Physical Description: | xii, 202 s. : il. ; 25 cm |
Cover
Table of contents
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| 100 | 1 | |a Egerton, R. F. |4 aut | |
| 245 | 1 | 0 | |a Physical principles of electron microscopy : |b an introduction to TEM, SEM, and AEM / |c Ray F. Egerton |
| 260 | |a New York, NY : |b Springer, |c c2005 | ||
| 300 | |a xii, 202 s. : |b il. ; |c 25 cm | ||
| 504 | |a Obsahuje bibliografické odkazy a rejstřík | ||
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