Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
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| Main Author | |
|---|---|
| Format | Book |
| Language | English |
| Published |
New York, NY :
Springer,
c2005
|
| Subjects | |
| ISBN | 9780387258000 0387258000 |
| Physical Description | xii, 202 s. : il. ; 25 cm |
Cover
| Bibliography: | Obsahuje bibliografické odkazy a rejstřík |
|---|---|
| ISBN: | 9780387258000 0387258000 |
| Physical Description: | xii, 202 s. : il. ; 25 cm |