Description: Physical principles of electron microscopy :

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM

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Bibliographic Details
Main Author:	Egerton, R. F. (Author)
Format:	Book
Language:	English
Published:	New York, NY : Springer, c2005
Subjects:	elektronová mikroskopie
ISBN:	9780387258000 0387258000
Physical Description:	xii, 202 s. : il. ; 25 cm

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Bibliography:	Obsahuje bibliografické odkazy a rejstřík
ISBN:	9780387258000 0387258000