Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York, NY :
Springer,
c2005
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| Subjects: | |
| ISBN: | 9780387258000 0387258000 |
| Physical Description: | xii, 202 s. : il. ; 25 cm |
Cover
Table of contents
Glossary of Terms|
Status Long term loan – Due : 21.12.2028 Recall This |
Description Location |
FT | Call Number | 537/EGERTON,R.F. |
|---|
| Status | Description | Location | Call Number | |
|---|---|---|---|---|
| Long term loan - Due : 21.12.2028 Recall This | FT | 537/EGERTON,R.F. |
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