Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XV

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civi...

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Format: Electronic
Language: Undetermined
Published: SPIE / International Society for Optical Engineering 2021.
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ISBN: 9781510640139
9781510640146
1510640142
Physical Description: 1 online resource

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