Reliability and failure of electronic materials and devices

"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...

Full description

Saved in:
Bibliographic Details
Main Author: Ohring, Milton, 1936-
Other Authors: Kasprzak, Lucian.
Format: eBook
Language: English
Published: Amsterdam ; Boston : Academic Press is an imprint of Elsevier, 2014.
Edition: Second edition.
Subjects:
ISBN: 9780080575520
0080575528
9780120885749
0120885743
9780128100363
Physical Description: 1 online resource

Cover

Table of contents