Nonlinear transistor model parameter extraction techniques

Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.

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Bibliographic Details
Other Authors Rudolph, Matthias, 1969-, Fager, Christian, Root, David E.
Format Electronic eBook
LanguageEnglish
Published Cambridge, UK ; New York : Cambridge University Press, 2012.
SeriesCambridge RF and microwave engineering series.
Subjects
Online AccessFull text
ISBN9781139161268
1139161261
9781139014960
113901496X
1139157442
9781139157445
9781139154659
1139154656
9781139159210
1139159216
1283342359
9781283342353
9780521762106
0521762103
Physical Description1 online resource (xiv, 352 pages) : illustrations

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