Microelectronics failure analysis : desk reference

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Bibliographic Details
Corporate Authors: ASM International., Electronic Device Failure Analysis Society.
Other Authors: Ross, Richard J.
Format: eBook
Language: English
Published: Materials Park, Ohio : ASM International, ©2011.
Edition: 6th ed.
Subjects:
ISBN: 9781613447598
1613447590
9781615037261
1615037268
161503725X
9781615037254
Physical Description: 1 online resource (xi, 660 pages) : illustrations

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