ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA

• Corporate Authors: International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society
• Format: Electronic eBook
• Language: English
• Published: Materials Park, Ohio : ASM International, 2010.
• Subjects: Electronics > Materials > Testing > Congresses.; Electronic apparatus and appliances > Testing > Congresses.; elektronické knihy; electronic books
• ISBN: 9781615037278; 1615037276; 9781680155105; 1680155105; 9780615030418; 9781615030415; 0615030416
• Physical Description: 1 online resource (xix, 464 pages) : color illustrations