Fundamental principles of engineering nanometrology

The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. The establishment of common standards will be an essentia...

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Bibliographic Details
Main Author Leach, R. K.
Format Electronic eBook
LanguageEnglish
Published Oxford : Amsterdam : William Andrew ; Elsevier Science, ©2010.
Edition1st ed.
SeriesMicro & nano technologies.
Subjects
Online AccessFull text
ISBN9780080964546
0080964540
1437778321
9781437778328
Physical Description1 online resource (xxvi, 321 pages) : illustrations

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