VLSI test principles and architectures : design for testability

• Other Authors: Wang, Laung-Terng, (Editor), Wu, Cheng-Wen, EE Ph. D., (Editor), Wen, Xiaoqing, (Editor)
• Format: eBook
• Language: English
• Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
• Series: Morgan Kaufmann series in systems on silicon.
• Subjects: Integrated circuits > Very large scale integration > Testing.; Integrated circuits > Very large scale integration > Design.; Integrated circuits > Very large scale integration > Design and construction.; elektronické knihy; electronic books
• ISBN: 9780080474793; 0080474799; 9780123705976; 0123705975
• Physical Description: 1 online resource (xxx, 777 pages) : illustrations

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...