Properties of amorphous silicon and its alloys

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Bibliographic Details
Corporate Author: INSPEC (Information service)
Other Authors: Searle, Tim, Dr.
Format: eBook
Language: English
Published: London : INSPEC, IEE, ©1998.
Series: EMIS datareviews series ; no. 19.
Subjects:
ISBN: 0852969228
9780852969229
1591248760
9781591248767
Physical Description: 1 online resource (xiv, 412 pages) : illustrations

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