Electronics reliability and measurement technology : nondestructive evaluation

• Other Authors: Heyman, Joseph S.
• Format: eBook
• Language: English
• Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
• Subjects: Integrated circuits > Reliability > Congresses.; Nondestructive testing > Congresses.; Integrated circuits > Testing > Congresses.; elektronické knihy; electronic books
• ISBN: 1591240514; 9781591240518; 9780815511717; 081551171X; 9780815516996; 0815516991; 9780080944685; 008094468X; 1282002295; 9781282002296; 9786612002298; 6612002298; 0815517009; 9780815517009
• Physical Description: 1 online resource (xii, 128 pages) : illustrations

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.