Electromigration inside logic cells : modeling, analyzing and mitigating signal electromigration in NanoCMOS
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...
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| Main Authors | , , |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Cham, Switzerland :
Springer,
2017.
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9783319488998 9783319488981 |
| Physical Description | 1 online resource |