Electromigration inside logic cells : modeling, analyzing and mitigating signal electromigration in NanoCMOS

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...

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Bibliographic Details
Main Authors Posser, Gracieli (Author), Sapatnekar, Sachin S., 1967- (Author), Reis, Ricardo (Author)
Format Electronic eBook
LanguageEnglish
Published Cham, Switzerland : Springer, 2017.
Subjects
Online AccessFull text
ISBN9783319488998
9783319488981
Physical Description1 online resource

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