Electromigration inside logic cells : modeling, analyzing and mitigating signal electromigration in NanoCMOS
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...
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Main Authors: | , , |
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Format: | eBook |
Language: | English |
Published: |
Cham, Switzerland :
Springer,
2017.
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Subjects: | |
ISBN: | 9783319488998 9783319488981 |
Physical Description: | 1 online resource |
Online Access:
Online Resources