Microelectronics failure analysis : desk reference

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Bibliographic Details
Other Authors	Ross, Richard J. (Editor)
Format	Book
Language	English
Published	Materials Park, Ohio : ASM International, [2011]
Edition	Sixth edition
Subjects	mikroelektronika testování elektronických systémů elektronická zařízení vady materiálů technická diagnostika microelectronics testing of electronic systems electronic apparatus and appliances material defects technical diagnostics příručky handbooks and manuals
ISBN	9781615037254 1-61503-725-X 978-1-61503-834-3
Physical Description	xi, 660 stran : ilustrace ; 28 cm + 1 CD-ROM

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Holdings details from Knihovna UTB
Status	More Information	Location	Call Number
Status Long term loan – Due: 21.12.2028	More Information + 1 CD-ROM	Location FAI	Call Number 621.38/MICROELECTRONICS