Holdings: Microelectronics failure analysis :

Microelectronics failure analysis : desk reference

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Bibliographic Details
Other Authors:	Ross, Richard J. (Editor)
Format:	Book
Language:	English
Published:	Materials Park, Ohio : ASM International, [2011]
Edition:	Sixth edition
Subjects:	mikroelektronika testování elektronických systémů elektronická zařízení vady materiálů technická diagnostika microelectronics testing of electronic systems electronic apparatus and appliances material defects technical diagnostics příručky handbooks and manuals
ISBN:	9781615037254 1-61503-725-X 978-1-61503-834-3
Physical Description:	xi, 660 stran : ilustrace ; 28 cm + 1 CD-ROM

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Status	Description	Location	Call Number
Status Long term loan – Due : 21.12.2028 Recall This	Description + 1 CD-ROM Location	FAI	Call Number	621.38/MICROELECTRONICS

Status	Description	Location	Call Number
Long term loan - Due : 21.12.2028 Recall This	+ 1 CD-ROM	FAI	621.38/MICROELECTRONICS