Scanning electron microscopy : physics of image formation and microanalysis

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Bibliographic Details
Main Author: Reimer, Ludwig, 1928-2001 (Author)
Format: Book
Language: English
Published: Berlin : Springer, [2010]
Edition: Second completly revised and updated edition
Series: Springer series in optical sciences
Subjects:
skenovací elektronová mikroskopie
scanning electron microscopy
monografie
monographs
ISBN: 9783642083723
Physical Description: xiv, 527 stran : ilustrace ; 24 cm

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