Scanning electron microscopy : physics of image formation and microanalysis
Saved in:
| Main Author | |
|---|---|
| Format | Book |
| Language | English |
| Published |
Berlin :
Springer,
[2010]
|
| Edition | Second completly revised and updated edition |
| Series | Springer series in optical sciences
|
| Subjects | |
| ISBN | 9783642083723 |
| ISSN | 0342-4111 ; |
| Physical Description | xiv, 527 stran : ilustrace ; 24 cm |
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