Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics 2010, June 3-5, 2010, Tokyo Institute of Technology, Tokyo, Japan

Silicon ultra-large scale integrated circuits (ULSIs) are now faced with various physical limits to further scaling. Therefore, it is very important to establish the fundamental science and technology required to produce nano-scale complementary metal-oxide-semiconductor devices (Nano-CMOS) having h...

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Corporate Author: International Symposium on Technology Evolution for Silicon Nano-Electronics Tokyo Institute of Technology)
Other Authors: Miyazaki, Seiichi., Tabata, Hitoshi.
Format: eBook
Language: English
Published: Stafa-Zurich, Switzerland ; Enfield, N.H. : Trans Tech Publications, c2011.
Series: Key engineering materials ; v. 470.
Subjects:
ISBN: 9783038134947
9781628705164
9783037850510
Physical Description: 1 online zdroj (xi, 234 p. :) ill.

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