Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics 2010, June 3-5, 2010, Tokyo Institute of Technology, Tokyo, Japan

Silicon ultra-large scale integrated circuits (ULSIs) are now faced with various physical limits to further scaling. Therefore, it is very important to establish the fundamental science and technology required to produce nano-scale complementary metal-oxide-semiconductor devices (Nano-CMOS) having h...

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Bibliographic Details
Corporate Author International Symposium on Technology Evolution for Silicon Nano-Electronics Tokyo Institute of Technology
Other Authors Miyazaki, Seiichi, Tabata, Hitoshi
Format eBook
LanguageEnglish
Published Stafa-Zurich, Switzerland ; Enfield, N.H. : Trans Tech Publications, c2011.
SeriesKey engineering materials ; v. 470.
Subjects
Online AccessFull text
ISBN9783038134947
9781628705164
9783037850510
ISSN1013-9826 ;
Physical Description1 online zdroj (xi, 234 p. :) ill.

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