Measurement technology and intelligent instruments IX selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia

• Corporate Author: International Symposium on Measurement Technology and Intelligent Instruments Saint Petersburg, Russia)
• Other Authors: Chugui, Yuri V.
• Format: eBook
• Language: English
• Published: Stafa-Zuerich ; Enfield, NH : Trans Tech Publications, c2010.
• Series: Key engineering materials ; v. 437.
• Subjects: Engineering instruments > Congresses.; Measuring instruments > Congresses.; elektronické knihy; electronic books
• ISBN: 9781613447161; 9780878492732; 9783038133551
• Physical Description: 1 online zdroj (xx, 656 p.) : ill.

This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, indus...