Reliability and failure of electronic materials and devices

"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...

Full description

Saved in:
Bibliographic Details
Main Author Ohring, Milton, 1936-
Other Authors Kasprzak, Lucian
Format Electronic eBook
LanguageEnglish
Published Amsterdam ; Boston : Academic Press is an imprint of Elsevier, 2014.
EditionSecond edition.
Subjects
Online AccessFull text
ISBN9780080575520
9780120885749
Physical Description1 online zdroj.

Cover