Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

• Corporate Author: Institution of Engineering and Technology.
• Other Authors: Sun, Yichuang. (Editor)
• Format: eBook
• Language: English
• Published: London : Institution of Engineering and Technology, 2008.
• Series: IET circuits, devices and systems series ; 19.
• Subjects: Linear integrated circuits > Testing.; Mixed signal circuits > Testing.; Radio frequency integrated circuits > Testing.; elektronické knihy; electronic books
• ISBN: 9780863419997; 9780863417450; 9781615833153
• Physical Description: 1 online zdroj (xx, 389 pages) : illustrations.