Properties of amorphous silicon and its alloys

• Corporate Author: INSPEC (Information service)
• Other Authors: Searle, Tim, Dr.
• Format: eBook
• Language: English
• Published: London : INSPEC, IEE, c1998.
• Series: EMIS datareviews series ; no. 19.
• Subjects: Silicon.; Silicon alloys.; Amorphous semiconductors.; elektronické knihy; electronic books
• ISBN: 9780852969229; 9781591248767
• Physical Description: 1 online zdroj (xiv, 412 p.) : ill.