Electronics reliability and measurement technology nondestructive evaluation

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Bibliographic Details
Other Authors Heyman, Joseph S.
Format Electronic eBook
LanguageEnglish
Published Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
Subjects
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
elektronické knihy
electronic books
Online AccessFull text
ISBN9781591240518
9780815511717
9780815516996
9780815517009
9780080944685
Physical Description1 online zdroj (xii, 128 pages) : illustrations

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