Electronics reliability and measurement technology nondestructive evaluation

• Other Authors: Heyman, Joseph S.
• Format: eBook
• Language: English
• Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
• Subjects: Integrated circuits > Reliability > Congresses.; Nondestructive testing > Congresses.; Integrated circuits > Testing > Congresses.; elektronické knihy; electronic books
• ISBN: 9781591240518; 9780815511717; 9780815516996; 9780815517009; 9780080944685
• Physical Description: 1 online zdroj (xii, 128 pages) : illustrations

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.