An introduction to mixed-signal IC test and measurement

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...

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Bibliographic Details
Main Author: Roberts, Gordon W., 1959-
Other Authors: Taenzler, Friedrich., Burns, Mark, 1962-
Format: eBook
Language: English
Published: New York : Oxford University Press, c2012.
Edition: 2nd ed.
Series: Oxford series in electrical and computer engineering.
Subjects:
ISBN: 9781613449486
9780199796212
Physical Description: 1 online zdroj (xxv, 836 p.) : ill.

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