Atomic force microscopy in process engineering introduction to AFM for improved processes and products

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...

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Bibliographic Details
Other Authors: Bowen, W. Richard., Hilal, Nidal.
Format: eBook
Language: English
Published: Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009.
Edition: 1st ed.
Series: Butterworth-Heinemann/IChemE series.
Subjects:
ISBN: 9780080949574
9781856175173
Physical Description: 1 online zdroj (xvi, 283 pages) : illustrations.

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