Atomic force microscopy in process engineering introduction to AFM for improved processes and products
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...
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Other Authors: | , |
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Format: | eBook |
Language: | English |
Published: |
Oxford ; Burlington, MA :
Butterworth-Heinemann,
©2009.
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Edition: | 1st ed. |
Series: | Butterworth-Heinemann/IChemE series.
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Subjects: | |
ISBN: | 9780080949574 9781856175173 |
Physical Description: | 1 online zdroj (xvi, 283 pages) : illustrations. |
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