Properties of porous silicon

• Corporate Author: INSPEC (Information service)
• Other Authors: Canham, Leigh T.
• Format: eBook
• Language: English
• Published: London : IEE : INSPEC, ©1987.
• Series: EMIS datareviews series ; no. 18.
• Subjects: Porous silicon.; Semiconductors.; elektronické knihy; electronic books
• ISBN: 9781591248583; 9780852969328
• Physical Description: 1 online zdroj (xviii, 405 pages) : illustrations.