Logic testing and design for testability

• Main Author: Fujiwara, Hideo.
• Format: eBook
• Language: English
• Published: Cambridge, Mass. : MIT Press, c1985.
• Series: MIT Press series in computer systems.
• Subjects: Logic circuits > Testing.; elektronické knihy; electronic books
• ISBN: 9780262256186
• Physical Description: 1 online zdroj (x, 284 p.) : ill.