Quality aspects in spatial data mining

• Other Authors: Stein, Alfred., Shi, John., Bijker, Wietske, 1965-
• Format: eBook
• Language: English
• Published: Boca Raton, FL : Chapman & Hall/CRC, 2008.
• Subjects: Geographic information systems.; Spatial analysis (Statistics); elektronické knihy; electronic books
• ISBN: 9781420069273
• Physical Description: 374 p.