Holdings: Lab VIEW run four point probe device :

Lab VIEW run four point probe device : electrical characterization of semiconducting thin films made easy by four point probe system controlled by LabVIEW

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Bibliographic Details
Main Authors:	Agumba, John (Author), Karimi, Patrick (Author), Okumu, John (Author)
Format:	Book
Language:	English
Published:	Saarbrücken : LAP LAMBERT Academic Publishing, c2012
Subjects:	fyzika tenkých vrstev tenké vrstvy polovodiče elektrická vodivost elektrické vlastnosti materiálů zkoušení materiálů automatizované měřicí systémy physics of thin layers thin films semiconductors electric conductivity electric properties of materials material testing automated measuring systems LabView studie studies
ISBN:	9783659134821
Physical Description:	xix, 116 s. : il. ; 23 cm

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Status	Description	Location	Call Number
Status Long term loan – Due : 21.12.2028 Recall This	Description Location	FT	Call Number	53/AGUMBA,J.

Status	Description	Location	Call Number
Long term loan - Due : 21.12.2028 Recall This		FT	53/AGUMBA,J.