Atomic force microscopy in process engineering : an introduction to AFM for improved processes and products

Saved in:

Bibliographic Details
Other Authors	Bowen, W. Richard (Editor), Hilal, Nidal (Editor)
Format	Book
Language	English
Published	Oxford : Butterworth-Heinemann, 2009
Edition	1st ed.
Series	Butterworth-Heinemann/IChemE series
Subjects	mikroskopie atomárních sil skenovací mikroskopie mikroskopické zkoumání materiálů atomic force microscopy scanning probe microscopy microscopic examination of materials kolektivní monografie collective monographs
ISBN	9781856175173
Physical Description	xvi, 283 s. : il. ; 24 cm

Cover

Glossary of Terms

You have to be logged in to reserve borrowed books or request items from the archive.

Holdings details from Knihovna UTB
Status	More Information	Location	Call Number
Status Long term loan – Due: 21.12.2028	More Information	Location FT	Call Number 53/ATOMIC
Status Long term loan – Due: 21.12.2028	More Information	Location CPS	Call Number 53/ATOMIC