Holdings: Atomic force microscopy in process engineering :

Atomic force microscopy in process engineering : an introduction to AFM for improved processes and products

Saved in:

Bibliographic Details
Other Authors:	Bowen, W. Richard (Editor), Hilal, Nidal (Editor)
Format:	Book
Language:	English
Published:	Oxford : Butterworth-Heinemann, 2009
Edition:	1st ed.
Series:	Butterworth-Heinemann/IChemE series
Subjects:	mikroskopie atomárních sil skenovací mikroskopie mikroskopické zkoumání materiálů atomic force microscopy scanning probe microscopy microscopic examination of materials kolektivní monografie collective monographs
ISBN:	9781856175173
Physical Description:	xvi, 283 s. : il. ; 24 cm

Cover

Cover Image

Table of contents

Glossary of Terms

Status	Description	Location	Call Number
Status Long term loan – Due : 21.12.2028 Recall This	Description Location	CPS	Call Number	53/ATOMIC
Status Long term loan – Due : 21.12.2028 Recall This	Description Location	FT	Call Number	53/ATOMIC

Status	Description	Location	Call Number
Long term loan - Due : 21.12.2028 Recall This		CPS	53/ATOMIC
Long term loan - Due : 21.12.2028 Recall This		FT	53/ATOMIC