Atomic force microscopy : understanding basic modes and advanced applications

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Bibliographic Details
Main Author	Haugstad, Greg, 1963- (Author)
Format	Book
Language	English
Published	Hoboken, N.J. : John Wiley & Sons, c2012
Subjects	mikroskopie atomárních sil atomic force microscopy monografie monographs
Online Access	Anotace Biografické informace Obsah
ISBN	9780470638828
Physical Description	xxii, 464 s. : il. ; 25 cm

Online Access

Anotace
Biografické informace
Obsah

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Holdings details from Knihovna UTB
Status	More Information	Location	Call Number
Status Long term loan – Due: 21.12.2028	More Information	Location FAI	Call Number 53/HAUGSTAD,G.
Status Long term loan – Due: 21.12.2028	More Information	Location CPS	Call Number 53/HAUGSTAD,G.