Atomic force microscopy : understanding basic modes and advanced applications

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Bibliographic Details
Main Author: Haugstad, Greg, 1963- (Author)
Format: Book
Language: English
Published: Hoboken, N.J. : John Wiley & Sons, c2012
Subjects:
mikroskopie atomárních sil
atomic force microscopy
monografie
monographs
ISBN: 9780470638828
Physical Description: xxii, 464 s. : il. ; 25 cm

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Table of contents

ikona NpovdaGlossary of Terms
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Status Description Location Call Number
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Long term loan – Due : 20.12.2024  Recall This 		Description

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 CPS Call Number 53/HAUGSTAD,G.
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Long term loan – Due : 21.12.2028  Recall This 		Description

Location
 FAI Call Number 53/HAUGSTAD,G.

Status Description Location Call Number
Long term loan - Due : 20.12.2024  Recall This CPS 53/HAUGSTAD,G.
Long term loan - Due : 21.12.2028  Recall This FAI 53/HAUGSTAD,G.

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