Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications

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Bibliographic Details
Main Author	Rein, Stefan (Author)
Format	Book
Language	English
Published	Berlin ; Heidelberg ; New York : Springer, [2005]
Series	Springer series in materials science
Subjects	spektroskopie polovodiče fotovoltaika silikony elektronová spektroskopie technická diagnostika spectroscopic analysis semiconductors photovoltaics silicones electron spectroscopy technical diagnostics monografie monographs
ISBN	3540253033 978-3-540-25303-7
ISSN	0933-033X ;
Physical Description	xxvi, 489 stran : ilustrace ; 25 cm

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Holdings details from Knihovna UTB
Status	More Information	Location	Call Number
Status In house loan	More Information	Location Study room - 3rd floor	Call Number 543/REIN,S.