Holdings: Lifetime spectroscopy :

Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications

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Bibliographic Details
Main Author:	Rein, Stefan (Author)
Format:	Book
Language:	English
Published:	Berlin ; Heidelberg ; New York : Springer, [2005]
Series:	Springer series in materials science
Subjects:	spektroskopie polovodiče fotovoltaika silikony elektronová spektroskopie technická diagnostika spectroscopic analysis semiconductors photovoltaics silicones electron spectroscopy technical diagnostics monografie monographs
ISBN:	3540253033 978-3-540-25303-7
Physical Description:	xxvi, 489 stran : ilustrace ; 25 cm

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Status	Description	Location	Call Number
Status In house loan	Description Location	Study room - 3rd floor	Call Number	543/REIN,S.

Status	Description	Location	Call Number
In house loan		Study room - 3rd floor	543/REIN,S.