Scanning electron microscopy and X-ray microanalysis

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Bibliographic Details
Main Author	Goldstein, Joseph, 1939- (Author)
Format	Book
Language	English
Published	New York : Springer, 2003
Edition	3rd ed.
Subjects	skenovací elektronová mikroskopie elektronová mikroanalýza rentgenová spektroskopie scanning electron microscopy electron probe microanalysis X-ray spectroscopy monografie monographs
ISBN	0306472929 978-0-306-47292-3
Physical Description	xix, 690 s., [6] s. obr. příl. : il. ; 26 cm + 1 CD-ROM

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