Scanning electron microscopy and X-ray microanalysis

Saved in:
Bibliographic Details
Main Author: Goldstein, Joseph, 1939- (Author)
Format: Book
Language: English
Published: New York : Springer, 2003
Edition: 3rd ed.
Subjects:
skenovací elektronová mikroskopie
elektronová mikroanalýza
rentgenová spektroskopie
scanning electron microscopy
electron probe microanalysis
X-ray spectroscopy
monografie
monographs
ISBN: 0306472929 978-0-306-47292-3
Physical Description: xix, 690 s., [6] s. obr. příl. : il. ; 26 cm + 1 CD-ROM

Cover

Table of contents

ikona NpovdaGlossary of Terms
Status Description Location Call Number
Status
Long term loan – Due : 22.12.2027 		Description
+ 1 CD
Location
 FT Call Number 537/SCANNING
Status
Long term loan – Due : 21.12.2028 		Description

Location
 FT Call Number 537/SCANNING
Status
In house loan 		Description
+ 1 CD
Location
 Study room - 3rd floor Call Number 537/SCANNING

Status Description Location Call Number
Long term loan - Due : 22.12.2027 + 1 CD FT 537/SCANNING
Long term loan - Due : 21.12.2028 FT 537/SCANNING
In house loan + 1 CD Study room - 3rd floor 537/SCANNING

Similar Items