Structural and Chemical Analysis of Materials : X-ray, electron and neutron diffraction. X-ray, electron and ion spectrometry. Electron microscopy

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Bibliographic Details
Main Author Eberhart, Jean-Pierre (Author)
Format Book
LanguageEnglish
Published Chichester : John Wiley & Sons, 1995
Subjects
chemická analýza
difrakce
elektronová mikroskopie
elektrony
ionty
materiály
neutrony
rentgenová difrakce
rentgenová spektroskopie
spektrometrie
struktura
ISBN0471950149
Physical Description545 s.

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ikona Nápověda Glossary of Terms
Status More Information Location Call Number
Holdings details from Knihovna UTB
Status Long term loan – Due: 31.12.2099 More Information Location FT Call Number 543/EBERHART,J.P.

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