Holdings: Structural and Chemical Analysis of Materials :

Structural and Chemical Analysis of Materials : X-ray, electron and neutron diffraction. X-ray, electron and ion spectrometry. Electron microscopy

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Bibliographic Details
Main Author:	Eberhart, Jean-Pierre (Author)
Format:	Book
Language:	English
Published:	Chichester : John Wiley & Sons, 1995
Subjects:	chemická analýza difrakce elektronová mikroskopie elektrony ionty materiály neutrony rentgenová difrakce rentgenová spektroskopie spektrometrie struktura
ISBN:	0471950149
Physical Description:	545 s.

Status	Description	Location	Call Number
Status Long term loan – Due : 31.12.2099 Recall This	Description Location	FT	Call Number	543/EBERHART,J.P.

Status	Description	Location	Call Number
Long term loan - Due : 31.12.2099 Recall This		FT	543/EBERHART,J.P.