Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...

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Bibliographic Details
Main Authors Zuo, Jian Min (Author), Spence, John C.H (Author)
Corporate Author SpringerLink (Online service)
Format Electronic eBook
LanguageEnglish
Published New York, NY : Springer New York : Imprint: Springer, 2017.
Subjects
Online AccessFull text
ISBN9781493966073
DOI10.1007/978-1-4939-6607-3
Physical Description1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.)

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