Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...

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Bibliographic Details
Main Authors: Zuo, Jian Min. (Author), Spence, John C.H. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language: English
Published: New York, NY : Springer New York : Imprint: Springer, 2017.
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ISBN: 9781493966073
Physical Description: 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.)

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