Introduction to quantum metrology : the revised SI system and quantum standards
Saved in:
Main Author: | |
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Format: | Book |
Language: | English |
Published: |
Cham :
Springer,
2019
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Edition: | Second edition |
Subjects: | |
ISBN: | 978-3-030-19679-0 |
Physical Description: | xiv, 326 stran : ilustrace ; 24 cm |
Status Long term loan – Due : 21.12.2028 Recall This |
Description Location |
FAI | Call Number | 53/NAWROCKI,W. |
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Status | Description | Location | Call Number | |
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Long term loan - Due : 21.12.2028 Recall This | FAI | 53/NAWROCKI,W. |