Facilitating comparisons between simulated and actual behavior of electronic devices

• Main Authors: Masella, Anthony, Webster, Bruce
• Format: Patent
• Language: English
• Published: 02.01.2003

A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The simulation values include test patterns representing inputs to a device model, response data representing outputs from the device model, and expect data representing expected values of the response data in response to the test patterns. The actual waveform values include sampled inputs and outputs of an actual device under test (DUT), of the type presented by the model, and acquired using an electronic test system. When the DUT is exercised with test patterns that correspond to the test patterns stored in the first database, the DUT generates output that can be compared directly with the response data and/or expect data stored in the first database. The system according to the invention further includes software for aligning the data stored in the first and second databases, so that simulated and actual values can be readily compared. Analysis tools are included for examining similarities and differences between simulated and actual behavior. These include a graphical display for representing simulated and actual values. The graphical display enables a user of the system-generally the test developer-to visually identify instances in which the actual behavior of a DUT differs from the simulated behavior. The analysis tools may also include computer-processing features for scanning the first and second databases to automatically identify suspect areas in which actual and simulated behavior substantially differ.