Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

A new in-house developed three-dimensional scanning system for measuring electromagnetic fields close to devices and systems is presented. The scanning system is able to perform translations along a three-dimensional Cartesian grid with arbitrary grid size so that any electromagnetic field component...

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Bibliographic Details
Published in1996 IEEE Instrumentation and Measurement Technology Conference Proceedings Vol. 2; pp. 1119 - 1123 vol.2
Main Authors Haelvoet, K., Criel, S., Dobbelaere, F., Martens, L., De Langhe, P., De Smedt, R.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1996
Subjects
Electromagnetic compatibility
Electromagnetic fields
Electromagnetic measurements
Information technology
Magnetic analysis
Magnetic field measurement
Performance evaluation
Probes
Size measurement
Telecommunications
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ISBN0780333128
9780780333123
DOI10.1109/IMTC.1996.507338

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Summary:A new in-house developed three-dimensional scanning system for measuring electromagnetic fields close to devices and systems is presented. The scanning system is able to perform translations along a three-dimensional Cartesian grid with arbitrary grid size so that any electromagnetic field component can be measured with high accuracy and detail. A near-field scan of an AT motherboard and of a telecom subsystem is described to illustrate the performance of the scanning system. The measurements show that the scanning, system is an excellent diagnostic tool for the detection of EMC problems in an early stage of product development.
ISBN:0780333128
9780780333123
DOI:10.1109/IMTC.1996.507338