THREE-DIMENSIONAL SHAPE MEASUREMENT SYSTEM, THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD, AND THREE-DIMENSIONAL SHAPE MEASUREMENT PROGRAM

To provide a three-dimensional shape measurement system that is advantageous to excluding a decoding point by interreflection and performing a three-dimensional shape measurement even as to an overlapping point where decoding information on a direct reflection component cannot be separated from deco...

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Bibliographic Details
Main Authors SUMIYOSHI SHINICHI, HIURA SHINSAKU
Format Patent
LanguageEnglish
Japanese
Published 15.02.2021
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Summary:To provide a three-dimensional shape measurement system that is advantageous to excluding a decoding point by interreflection and performing a three-dimensional shape measurement even as to an overlapping point where decoding information on a direct reflection component cannot be separated from decoding information on an interreflection component under only an epipolar constraint.SOLUTION: A three-dimensional shape measurement system 100 comprises: a projection part 2 that projects a coded pattern image row in sequence; an imaging unit 1 that images an object to which the coded pattern image is projected in the projection part 2 in sequence, and acquires an imaging image row; a decoding unit 51 that acquires decoding information as separating decoding information on a direct reflection component from decoding information on an interreflection component as to an overlapping point on the basis of the coded pattern image row and imaging image row; a three-dimensional shape measurement unit 53 that obtains decompression by a geometric calculation, using the decoding information, and thereby measures a three-dimensional shape of the object; and a geometry constraint processing unit 522 that performs geometry constraint processing of excluding a decompression point off a prescribed constraint range.SELECTED DRAWING: Figure 2 【課題】 エピポーラ拘束のみでは直接反射成分の復号化情報であるか相互反射成分の復号化情報であるかを分離できない重畳点についても、相互反射による復元点を排除して3次元形状計測をするのに有利な3次元形状計測システムを提供する。【解決手段】 3次元形状計測システム100は、符号化パターン画像列を順に投影する投影部2と、投影部2にて符号化パターン画像が投影される対象物を順に撮像して、撮像画像列を取得する撮像部1と、符号化パターン画像列及び撮像画像列に基づいて、重畳点については直接反射成分の復号化情報と相互反射成分の復号化情報とに分離しつつ復号化情報を取得する復号化部51と、復号化情報を用いて、幾何計算により復元点を求めることにより対象物の3次元形状を計測する3次元形状計測部53と、所定の拘束範囲外の復元点を排除するジオメトリ拘束処理を行うジオメトリ拘束処理部522とを備えている。【選択図】 図2
Bibliography:Application Number: JP20190135943