Linear active disturbance rejection control parameter initial value calculation method for photoelectric platform

The invention provides a linear active disturbance rejection control parameter initial value calculation method for a photoelectric platform. The method comprises the steps of establishing an equivalent two-degree-of-freedom control model of an LADRC controller, calculating a transfer function of an...

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Main Authors YUAN JIAN, CHEN LONG, JIANG HUHAI, MOU TINGJIE, LI DENGKE, ZHANG TONGTONG, WANG HAO, ZHOU JIAN, WU HUI
Format Patent
LanguageChinese
English
Published 25.04.2025
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Summary:The invention provides a linear active disturbance rejection control parameter initial value calculation method for a photoelectric platform. The method comprises the steps of establishing an equivalent two-degree-of-freedom control model of an LADRC controller, calculating a transfer function of an in-loop controller C (s), calculating an observer bandwidth of the LADRC controller, calculating a control gain of the LADRC controller, and calculating a time constant of a low-pass filter. According to the method, the proportional-integral controller parameters are converted into the linear active-disturbance-rejection control parameters, it can be ensured that when the LADRC replaces a PI controller, approximate control performance is obtained, smooth transition is achieved, and a foundation is laid for practical application of the linear active-disturbance-rejection controller in photoelectric platform control. 本发明提出一种针对光电平台的线性自抗扰控制参数初值计算方法,包括建立LADRC控制器的等效二自由度控制模型,计算环内控制器C(s)的传递函数,计算LADRC控制器的观测器带宽,计算LADRC控制器的控
Bibliography:Application Number: CN202411935359