Digital full-life-cycle management method and device for test flight test parameters

• Main Authors: DING JUNLIANG, XIAO WENFU, LYU PENGTAO, WU LIANG, DU YIJIE
• Format: Patent
• Language: Chinese; English
• Published: 09.04.2024
• Subjects: AIRCRAFT; AVIATION; CALCULATING; COMPUTING; COSMONAUTICS; COUNTING; DESIGNING, MANUFACTURING, ASSEMBLING, CLEANING, MAINTAINING ORREPAIRING AIRCRAFT, NOT OTHERWISE PROVIDED FOR; ELECTRIC DIGITAL DATA PROCESSING; GROUND OR AIRCRAFT-CARRIER-DECK INSTALLATIONS SPECIALLYADAPTED FOR USE IN CONNECTION WITH AIRCRAFT; HANDLING, TRANSPORTING, TESTING OR INSPECTING AIRCRAFTCOMPONENTS, NOT OTHERWISE PROVIDED FOR; PERFORMING OPERATIONS; PHYSICS; TRANSPORTING

The invention belongs to a test technology, and particularly relates to a test flight test parameter definition and full-life-cycle management method and a test flight test parameter definition and full-life-cycle management device. The method comprises the following steps: in a preliminary design stage of test flight, proposing test parameter requirements while defining subject test points, and completing preliminary definition of test parameters; in the detailed design stage of test flight, the definition of test parameters is perfected, and the test parameters of enforceable levels are obtained; converting the test parameters into measurable parameters, and associating the measurable parameters with the test equipment; according to the test flight condition, marking the implementation state of the test parameter, and recording the parameter implementation result; and analyzing and acquiring test data according to a recording result of the test parameters, performing engineering analysis on the test data, a