X-ray absorption spectrometer based on elliptical bent crystal

• Main Authors: XING LINA, CHEN ZUOLEI, ZHU NING, SHEN JIN
• Format: Patent
• Language: Chinese; English
• Published: 07.04.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses an X-ray absorption spectrometer based on an elliptical bent crystal. The X-ray absorption spectrometer comprises a light source, a sample to be detected, a slit, a detector and the elliptical bent crystal, the reflecting surface of the elliptical bent crystal is an elliptical cylindrical surface or an ellipsoidal surface; a light emitting point of a light outlet of the light source is located on a first focus F1 of the ellipse, and the slit is located on a second focus F2 of the ellipse; after the incident light is reflected by the elliptical bent crystal, the emergent light is focused at a second focus F2 of the ellipse; the to-be-detected sample is located on the light path; the light beam focused at the second focus F2 passes through the slit, and the light beam passing through the slit is detected by the detector to obtain the spectrum of the light beam. The X-ray absorption spectrometer based on the elliptical bent crystal has the advantages that the spectral resolution is improv