电子产品在电压应力作用下的小样本试验寿命预测方法

本发明提供一种电子产品在电压应力作用下的小样本试验寿命预测方法，其包括以下步骤：S1对失效数据按照电压应力水平分组并从小到大重排；S2依照矩模型得到威布尔寿命分布形式；S3得到等效威布尔寿命数据；S4计算调协威布尔寿命分布；S5列出关注的信度并计算信度对应的分位值；S6得到各信度水平下电压应力-寿命函数；S7得到选定电压应力水平下的威布尔寿命分位值；S8使用最小二乘模型得到选定电压应力水平下的寿命分布。本发明根据不确定理论通过分布参数的估计、电子产品寿命数据扩充，修正分布参数，最终得到电压应力-寿命模型，解决了小样本情况造成的威布尔分布参数估计不准确问题，提高了寿命评估的准确性和稳定性。 Th...

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Bibliographic Details
Format Patent
LanguageChinese
Published 28.05.2024
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:本发明提供一种电子产品在电压应力作用下的小样本试验寿命预测方法，其包括以下步骤：S1对失效数据按照电压应力水平分组并从小到大重排；S2依照矩模型得到威布尔寿命分布形式；S3得到等效威布尔寿命数据；S4计算调协威布尔寿命分布；S5列出关注的信度并计算信度对应的分位值；S6得到各信度水平下电压应力-寿命函数；S7得到选定电压应力水平下的威布尔寿命分位值；S8使用最小二乘模型得到选定电压应力水平下的寿命分布。本发明根据不确定理论通过分布参数的估计、电子产品寿命数据扩充，修正分布参数，最终得到电压应力-寿命模型，解决了小样本情况造成的威布尔分布参数估计不准确问题，提高了寿命评估的准确性和稳定性。 The invention provides a small sample test life prediction method of an electronic product under the action of voltage stress. The method comprises the following steps: S1, grouping failure data according to the voltage stress level and rearranging the failure data from small to large; s2, obtaining a Weibull life distribution form according to a moment model; s3, obtaining equivalent Weibull life data; s4, calculating scheduling Weibull life distribution; s5, listing concerned reliability and calculating quantiles corresponding to the reliability; s6, obtaining a voltage stress-life function under each reliability level; s7, obtaining a Weibull life quantile under the selected voltage stress level; and S8, obtaining
Bibliography:Application Number: CN202210590286