一种基于多应力加速寿命模型的试验时间计算方法

• Format: Patent
• Language: Chinese
• Published: 02.08.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

本发明提供一种基于多应力加速寿命模型的试验时间计算方法，解决了多应力条件下(振动、温度、湿度、电等多种应力参数)电子产品贮存期验证的问题。步骤一、分析贮存期指标，得到运输时间，存放时间，加电待机时间；步骤二、分解贮存剖面，得到运输阶段的振动量级、存放阶段的温度湿度值、加电待机阶段的电压值；步骤三、分析试验应力，得到运输阶段的振动应力、存放阶段的最高温度应力和最高湿度应力、加电待机阶段的最高电应力；步骤四、计算运输阶段的加速因子、存放阶段的加速因子和加电待机阶段的加速因子；步骤五、根据加速因子计算试验时间。 The invention provides a test time calculation method based on a multi-stress accelerated life model. With the method adopted, the problem of the verification of the storage period of an electronic product under a multi-stress condition (various stress parameters such as vibration, temperature, humidity and electricity) can be solved. The method comprises the following steps of: step 1, analyzingstorage period indexes to obtain transportation time, storage time and power-up standby time; 2, decomposing a storage profile to obtain the vibration magnitude of a transportation stage, the temperature and humidity values of a storage stage and the voltage value of a power-up standby stage; 3, analyzing test stress to obtain the vibration stress in the transportati