An off-axis parabolic X-ray parallel bent crystal spectrometer device

• Main Authors: ZHANG SHUDONG, HAN PEIGAO, YANG SHANGGUO, SONG LIANKE, NIU MINGSHENG
• Format: Patent
• Language: Chinese; English
• Published: 07.05.2019
• Subjects: MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

The invention discloses an off-axis parabola type X-ray parallel bent crystal spectrometer with high resolution. The spectrometer comprises a collimation system, a light path adjusting system, an acquisition system and a vacuum cavity, the whole system can be adjusted in five dimensions including up-down, left-right, front-back, pitching and left-right swing, and the principle that X-rays passingthrough a parabola focus are parallel to the optical axis of a parabola after being diffracted by crystals during X measurement. The method comprises the steps that X-rays emitted by the X-ray sourcepass through the focal point of the parabola, are diffracted by the paraboloid bent crystal analyzer and then are detected by the X-ray CCD camera. The diffraction angle through the bent crystal analyzer main body can be regulated from 24 degrees to 45 degrees, the minimum regulation precision is 0.1 mrad, and the continuous measurement range is 0.1 nm-2 nm. According to the light path reversibility principle, the detector