Influence of atomic force microscope （AFM） probe shape on adhesion force measured in humidity environment
In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope （AFM） tips and substrate. The analysis shows that the precise tip geometry pla...
Saved in:
| Published in | 应用数学和力学：英文版 Vol. 35; no. 5; pp. 567 - 574 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
2014
|
| Online Access | Get full text |
| ISSN | 0253-4827 1573-2754 |
Cover
| Summary: | In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope （AFM） tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen- dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt （paraboloid） tip, the adhesion force versus humidity curves tends to the apparent contrast （peak-to-valley corrugation） with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla- tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines （triple point） on the probe profiles. The study provides insights for further under- standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments. |
|---|---|
| Bibliography: | In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope （AFM） tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen- dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt （paraboloid） tip, the adhesion force versus humidity curves tends to the apparent contrast （peak-to-valley corrugation） with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla- tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines （triple point） on the probe profiles. The study provides insights for further under- standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments. 31-1650/O1 capillary force, van der Waals force, adhesion force, curvatures probe shape Li YANG , Yu-song TU , Hui-li TAN （1. College of Physics Science and Technology, Guangxi Normal University, Guilin 541004, Guangxi Province, P. R. China; 2. Institute of Systems Biology, Shanghai University, Shanghai 200444, P. R. China） |
| ISSN: | 0253-4827 1573-2754 |